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DI-SORIC索瑞克高性能光幕OLGSP 12/12
更新時間：2017-05-08 點擊次數：714次
di-soric高性能光幕用于安全檢測晶片上的硅碎片，和檢測雙層晶片?？梢栽谏a過程中盡早檢測出有缺陷的晶片材料，以降低次品率。本系列光幕可以通過適配器調節以檢測不同尺寸的晶片。由于本系列光幕的緊湊型設計，它可以安裝在狹窄的空間。堅固的金屬外殼和高防護等級都是它的特點。高性能光幕Reliable detection of double layers and fragments larger 10 mmElectronic potentiometer for adjusting wafer thickness and fragment sizeInput for switching between wafer sizes 125 mm and 156 mm
Metal casingHigh protection class
Detection of fragments larger 15 mm
Electronic potentiometer for adjusting wafer thickness and fragement size
Input for switching between wafer sizes 125 mm and 156 mm
Small size for mounting between two belts
Metal casing
High protection class
| TECHNICAL INFORMATION (typ.) | +20°C, 24V DC |
|---|---|
| Size | 55 x 166 x 8 mm (Dimensions) |
| Number of beams | 12 |
| Emitted light | Infrared, clocked |
| Service voltage | 24 V DC + 10 % polarity-safe |
| Internal power consumption | 130 mA |
| Working distance | ≤ 50 mm Transmitter / Receiver (recommended) |
| Detection width | 156 / 125 mm switchable via pin selection "detection widths" |
| Penetrable wafer thickness | ≤ 300 μm (mono poly-crystalline silicium wafer material) |
| Transmitting power | 0…100 % digitally adjustable |
| Ambient temperature | +5 … +40 °C |
| Ambient light immunity | 50 kLx |
| Protection class | IP 67 |
| Protection degree | III, operation on protective low voltage |
| Casing material | Aluminium black anodized |
| Connection | Kabel PU 2,5m with connector M8, 3-polig |
